Ronald R. Willey¹, Fred T. Goldstein^2
1Willey Optical, Consultants, Melbourne, FL; ²FTG Software Associates, Princeton, NJ
Designing with varying indices of refraction versus thickness in very thin optical films was delt with in earlier papers by interpolating the magnitude of the indices for new thicknesses of that material between indices which have been measured for given thicknesses. This has generally proved successful for most applications but could prove problematic in the case of resonant peaks which shift in wavelength with layer thickness. This paper reports a solution to this problem by interpolating in not only the magnitude of the indices but also with the shifting wavelength. This should make it practical to deal with resonant plasmonic phenomena and quantum dot behavior. The possibilities and limitations of this interpolation approach are discussed.