Mike Simmons, Intellivation LLC., Loveland, CO
The integration of a Mid-Infrared (Mid IR) Tunable Quantum Cascade Laser (QCL) based reflectance spectrometer into a Roll-to-Roll (R2R) Sputter Coater offers enhanced spectral resolution and tunability, allowing for precise and selective analysis of materials during the coating process. Integrating this advanced spectrometer into a R2R Sputter Vacuum Coater enables real-time monitoring and control of thin film deposition, facilitating improved process optimization. The ability to monitor reflection across the IR wavelength contributes to the development of a much wider range of functional layer materials and provides a versatile and efficient manufacturing platform for high-throughput production of coated materials with tailored properties, offering new possibilities for applications in various industries.