Name
Under $98K Precision Layers Metrology Spectrometers: Surface Mappable Composition Depth Profiling Quantified…..
Date
Tuesday, May 20, 2025
Time
12:10 PM - 12:30 PM
Description

Ben Johns, Mass Spectrometry Instruments, Cayce, SC
The performance of vacuum coatings critical in industries such as microelectronics, automotive, aerospace, and optics depends on precise material composition, uniformity, and structural integrity. Understanding and controlling these properties requires advanced analytical methods for detailed surface layer characterization and plasma process monitoring. In vacuum coating technologies, this presentation explores the application of how GDMS, GDOES, LA-ICP-MS, and LIBS serves as a powerful tool for rapid surface analysis, offering advantages of no sample preparation, or minimal sample preparation techniques. This high precision material layers characterization of protective coatings, hard films, and corrosion-resistant layers, with its high spatial resolution, making it ideal for localized surface layer analysis of complex coatings, particularly for films with varying compositions or those subjected to specific surface treatments.
GDMS, GDOES, LA-ICP-MS, and LIBS with its ability to detect a broad range of elements, provide in-depth elemental analysis and depth profiling of thin film coatings, providing crucial insights into multilayer structures, interfaces, impurity levels, and compositional gradients is highly valuable for coatings used in high-performance applications, where uniformity and material composition are critical. 
Additionally, The LIBS, OES technique, used extensively for real-time process monitoring, enables immediate feedback during coating deposition, allowing for optimization of the plasma environment and material composition in-situ. .
This presentation explores how budget-friendly spectroscopic techniques, researchers and engineers can achieve high-quality, layer-by-layer analysis and elemental composition assessment, offering reliable results for quality control and process optimization without the need for expensive, high-end equipment. The presentation will discuss the practical applications, benefits, and strategies for implementing these spectrometric techniques in a cost-effective manner, empowering labs to achieve accurate, in-depth characterization of thin films while remaining within budget. By integrating these advanced spectrometric techniques into coating research, improvements and production, this session will demonstrate how they contribute to the development of next-generation coatings, offering a pathway toward enhanced materials performance and efficiency in vacuum coating applications.

Speakers
Ben Johns - Mass Spectrometry Instruments